Overview
Built on the exclusive SigOFIT TM leading technology, Micsig MOIP Series Optically Isolated Probes boast an extremely CMRR—still as high as 108dB at the 1GHz frequency bandalong with an isolation voltage of up to 85kV and a noise floor of less than 0.45mVrms. its bandwidth ranges from 200MHz to 1GHz, capable of measuring differential mode signals from ±0.01V to ±6250V. It reveals the complete truth of signals within its bandwidth range, serving as the ultimate judge for verifying the authenticity of signals measured by other voltage probes.
Key specifications
| Model | MOIP100P | MOIP200P | MOIP350P | MOIP500P | MOIP1000P |
|---|---|---|---|---|---|
| Bandwidth | 100MHz | 200MHz | 350MHz | 500MHz | 1GHz |
| Rise time | ≤ 3.5ns | ≤ 1.75ns | ≤ 1ns | ≤ 700ps | ≤ 450ps |
| CMRR | DC: 180dB 100MHz: 128dB |
DC: 180dB 200MHz: 122dB |
DC: 180dB 350MHz: 118dB |
DC: 180dB 500MHz: 114dB |
DC: 180dB 1GHz: 108dB |
| Differential Voltage Range | Standard: OP20(MMCX), ±25V Optional: OP50(MMCX), ±62.5V OP200(MCX), ±250V OP1000(MCX), ±1250V OP2000(MCX), ±2500V OP5000(LCX), ±6250V |
Standard: OP20(MMCX), ±25V OP1000(MCX), ±1250V Optional: OP50(MCX), ±62.5V OP200(MCX), ±250V OP2000(MCX), ±2500V OP5000(LCX), ±6250V |
Standard: OP20(MMCX), ±25V OP1000(MCX), ±1250V Optional: OP50(MCX), ±62.5V OP200(MCX), ±250V OP2000(MCX), ±2500V OP5000(LCX), ±6250V |
Standard: OP50(MMCX), ±25V Optional: OP20(MMCX), ±10V OP100(MCX), ±50V OP2000(MCX), ±1000V OP10000(LCX), ±5000V |
Standard: OP50(MMCX), ±25V Optional: OP20(MMCX), ±10V OP100(MCX), ±50V OP2000(MCX), ±1000V OP10000(LCX), ±5000V |
| Noise | <0.45mVrms | ||||
| DC Gain Accuracy | 1% | ||||
| Common Mode Voltage Range | 85kVpk | ||||
| Power Supply | DC 12V | ||||
| Fiber cable length | 2m (Customizable) | ||||
| Interface | Universal BNC | ||||
Applications
- Design of motor drive, power converter, electronic ballast
- Design of GaN, SiC, IGBT Half/Full bridge devices
- Design of inverter, UPS and switching power supply
- Safety test for high voltage, high bandwidth applications
- Power device evaluation
- Current shunt measurements
- EMI & ESD troubleshooting
- Floating measurements